The New FIB-SEM Electron Microscope Tescan Amber X
Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG. It enables the precise preparation and analysis of a wide range of applications for our customers.
The Tescan Amber X is a unique combination of field-free, ultra-high resolution BrightBeam™ SEM optics and Xenon Plasma FIB, which allows for the precise preparation and analysis of various applications. Are you already aware of its benefits?
An EDX detector with an extra-large detection window for the depiction of the specific composition of a surface completes the system.
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