The New FIB-SEM Electron Microscope Tescan Amber X

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Our FIB-SEM scanning electron microscope with focused ion beam has become an indispensable tool at IWG. It enables the precise preparation and analysis of a wide range of applications for our customers.
The Tescan Amber X is a unique combination of field-free, ultra-high resolution BrightBeam™ SEM optics and Xenon Plasma FIB, which allows for the precise preparation and analysis of various applications. Are you already aware of its benefits?

High throughput and large area FIB processing
Ultra-high resolution, field-free FEG-SEM imaging and analysis
High-resolution mass spectrometer
Rocking stage for improved polishing quality
Superior field of view for easy navigation
Easy-to-use, modular graphical user interface

An EDX detector with an extra-large detection window for the depiction of the specific composition of a surface completes the system.

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